Freiberg Instruments - Metrology Solutions
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    • Microwave Detected Photoconductivity (MDP)

      Electrical semiconductor characterization

    • TL/OSL

      Luminescence dating, research, dosimetry and more

    • Electro Spin Resonance (ESR)

      Free radical measurements in life science and biomedical applications

Freiberg Instruments - Metrology Solutions
  • µPCD/MDP (QSS)
    • MDPmap
    • MDPinline ingot
    • MDPinline
    • MDPspot
    • MDPpro
    • MDPlinescan
    • MDpicts
    • Applications
    • Technology
    • Publications
  • PID
    • PIDcon
    • PIDcheck
    • PIDStudio
    • Applications
    • Technology
    • Publications
  • X-ray diffraction
    • Omega/Theta X-ray diffractometer
    • DDCOM X-ray diffractometer
    • SDCOM
    • XRD-OEM
    • Quartz XRD
    • XRD and TXRF solutions
    • Major milestones
    • Applications
    • Technology
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    • Microelectronic Industry
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    • Research and Development
    • Crystal growth and processing
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  • µPCD/MDP (QSS)
    • MDPmap

      Mono- and Multi-crystalline wafer lifetime measurement device

    • MDPinline ingot

      State of the art system for topographic electrical characterization of multicrystalline bricks in fabs with high throughput....

    • MDPinline

      Production integrated high speed wafer mapping of carrier lifetime. Single wafer topograms in less than one second a wafer.

    • MDPspot

      Low cost table top lifetime measurement system for characterization of a variety of different silicon samples at different...

    • MDPpro

      Mono- and Multi-crystalline wafer and brick lifetime measurement device

    • MDPlinescan

      Flexible OEM unit for lifetime measurements at a variety of different samples ranging from mono- to multicrystalline silicon...

    • MDpicts

      Microwave Detected Photo Induced Current Transient Spectroscopy

    • Applications

      The minority carrier life time is sensitive for all kinds of electrically active defects in semiconductors and is therefore...

    • Technology

      MDP is an advanced technology with a so far unsurpassed combination of sensitivity, speed and resolution for fab and lab...

    • Publications

  • PID
    • PIDcon

      benchtop PID test for solar wafers and mini-modules

    • PIDcheck

      portable in field PID tester for solar modules

    • PIDStudio

      user friendly and advanced operating software

    • Applications

      The PIDcon devices are designed to investigate the PID susceptibility for production monitoring of solar cells as well as tests...

    • Technology

      Learn more about the reasons for PID and the how the susceptibility of solar cells, mini modules and encapsulation materials can...

    • Publications

  • X-ray diffraction
    • Omega/Theta

      For ultra-fast crystal orientation and rocking curve measurements

    • DDCOM

      Flexible diffractometer for ultra-fast Omega Scan orientation determination

    • SDCOM

      Smart diffractometer for ultra-fast Omega-scan of small samples.

    • XRD-OEM

      Robust XRD equipment for fully automated in-line testing & alignment

    • Quartz XRD

      for blanks, wafers & bars (AT, SC, TF, etc.)

    • XRD and TXRF solutions

      GNR products

    • Major milestones

      three generations of X-ray engineers

    • Applications

      in industrial production, R&D and more

    • Technology

      discover the most convenient way of measuring orientation of single crystals

    • Publications

  • Branches
    • Microelectronic Industry

      The microelectronic industry drives present global technological developments. It is one reason for the success of information...

    • Photovoltaic Industry

      Solar Energy is one of the key elements for the energy revolution that is currently taking place all over the world. In the last...

    • Research and Development

      Research and development is the driving force for the expanding market for semiconductor products in the PV and microelectronic...

    • Crystal growth and processing

      The impact of the development of the crystal growth methods on modern technology is often underestimated. We use products...

  • Projects
  • Company
    • About us

      Freiberg Instruments is one of the world's fast growing, young and dynamic analytical instrumentation companies

    • Technical service/support

      Technical support, Training, Warranty, Consultation, Seminars, Upgrades and more

    • ISO Certification

      Our quality management system is an integrated process-oriented system with ISO 9001 certification.

    • Awards & Recognitions

      going the extra mile

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      at Freiberg Instruments

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Sie unterstützen die Projektteams durch Ihr spezifisches Fachwissen und werden mit eigenen Projekten betraut oder in laufende Projekte integriert. Die selbständige Lösung von komplexen Fachaufgaben...

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Thesis/Abschlussarbeiten for Engineering - Bachelor/Master (m/w/d)

Sie unterstützen die Projektteams durch Ihr spezifisches Fachwissen und werden mit eigenen Projekten betraut oder in laufende Projekte integriert. Die selbständige Lösung von komplexen Fachaufgaben...

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Freiberg Instruments GmbH

Delfter Str. 6
09599 Freiberg / Germany

t   +49 3731 41954 0
f   +49 3731 41954 14

sales@freiberginstruments.com
support@freiberginstruments.com

Kreation:
599media GmbH

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MPD series / µPCD

  • MDPmap
  • MDPinline ingot
  • MDPinline
  • MDPspot
  • MDPpro
  • MDPlinescan
  • MDpicts
  • Applications
    • Resistance measurements on wafers and bricks
    • BiasMDP
    • Light Beam Induced Current (LBIC)
    • Minority carrier Lifetime maps on 450 mm wafers
    • Iron concentration determination
    • Microwave Detected Photo Induced Current Transient Spectroscopy (MD-PICTS)
    • MDP and MD-PICTS measurements on SiC and GaN
    • GaAs
    • p/n detection in bricks
    • Detection of CrB in silicon
    • Detection of BO2 in silicon
    • Trap concentration determination
    • Injection dependent measurements
    • InP
    • Inline metrology of mc-Si bricks
    • Highly spatial resolved inline metrology on Multicrystalline Silicon
    • Determination of passivation homogeneity and surface recombination velocity
    • Photoconductivity measurements of implanted samples
    • Lifetime determination of epitaxial silicon thin-film layers
  • Technology
    • Electrical characterization
      • Minority carrier lifetime
      • Photoconductivity
      • Resistivity
      • Mobility
      • Diffusion length
      • Defect properties
    • Simulations
      • Lifetime simulations
      • Simulation of carrier profiles
    • Microwave detected photoconductivity (MDP)
    • Comparison to µ-PCD and QSSPC
    • MD-PICTS
    • Penetration depth of different laser wavelength in silicon
    • Materials
    • Software - MDPStudio
    • Software - PICTSStudio
  • Publications

PID series

  • PIDcon
  • PIDcheck
  • PIDStudio
  • Applications
    • Production monitoring
    • EVA evaluation
    • Solar cell classification
    • Mini-module classification
    • Glass evaluation
  • Technology
    • Physical nature of PID-s
    • Comparison of PID test methods
    • Dependencies of PID susceptibility
    • Conductance test and power loss
    • Software - PIDStudio
  • Publications

XRD series / X-ray diffraction

  • Omega/Theta X-ray diffractometer
    • Omega/Theta - X-Y-stage
    • Omega/Theta - Stacking stage
    • Omega/Theta - Rocking curve measurement
    • Omega/Theta - Customized sample holders
  • DDCOM X-ray diffractometer
  • SDCOM
  • XRD-OEM
  • Quartz XRD
  • XRD and TXRF solutions
  • Major milestones
  • Applications
    • XRD surface mapping
      • Orientation mapping of crystalline surfaces
      • Rocking curve: Crystal surface evaluation
      • 3D Mapping of crystalline turbine blades
    • Quartz crystal processing
      • Quartz bar aligning
      • Automatic wafer sorting
      • Quartz blank sorting
    • XRD for large crystals, ingots & boules
      • Samples with a wide variety of geometry & size
      • Marking and measuring of in-plane directions
      • Crystal quality
      • Non-Linear Optical materials (NLO): Crystal quality and orientation determination
  • Technology
    • Omega-scan
    • Theta-scan
    • XRDStudio - Operating Software
  • Publications

Branches

  • Microelectronic Industry
  • Photovoltaic Industry
  • Research and Development
  • Crystal growth and processing

Projects

Company

  • About us
  • Technical service/support
    • Product training/installation
    • Product support
    • Spare parts availability
    • Limited warranty/Annual maintenance
    • Project consultation
  • ISO Certification
  • Awards & Recognitions
  • News
  • Your career
    • Experts
    • Students
  • Contact us
  • Imprint/Disclaimer
  • Privacy Policy

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